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Characterization of the piezoelectric-conversion properties of III-Nitride nanowires by conducting probe atomic force microscopy in intermittent contact mode

Noëlle Gogneau 1 Pascal Chrétien 2 Martina Morassi 1 Nicoletta Jegenyes 1 Laetitia Leroy 1 Laurent Travers 1 Maria Tchernycheva 3 Frédéric Houzé 2 
1 C2N - Centre de Nanosciences et de Nanotechnologies [Marcoussis]
2 GeePs - Laboratoire Génie électrique et électronique de Paris
3 C2N - Centre de Nanosciences et de Nanotechnologies [Orsay]
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Conference papers
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https://hal-centralesupelec.archives-ouvertes.fr/hal-01798287
Contributor : Frédéric Houzé Connect in order to contact the contributor
Submitted on : Wednesday, May 23, 2018 - 12:34:40 PM
Last modification on : Saturday, June 25, 2022 - 10:31:41 PM

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  • HAL Id : hal-01798287, version 1

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CNRS | CENTRALESUPELEC | GEEPS | PHEMADIC | UNIV-PARIS-SACLAY | SORBONNE-UNIVERSITE | SU-SCIENCES | UP-SCIENCES | GS-ENGINEERING | INSTITUT-SCIENCES-LUMIERE

Citation

Noëlle Gogneau, Pascal Chrétien, Martina Morassi, Nicoletta Jegenyes, Laetitia Leroy, et al.. Characterization of the piezoelectric-conversion properties of III-Nitride nanowires by conducting probe atomic force microscopy in intermittent contact mode. 4th International Conference on Nanogenerators and Piezotronics (NGPT2018), May 2018, Seoul, South Korea. ⟨hal-01798287⟩

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