HAL will be down for maintenance from Friday, June 10 at 4pm through Monday, June 13 at 9am. More information
Skip to Main content Skip to Navigation
Conference papers

Characterization of the piezoelectric-conversion properties of III-Nitride nanowires by conducting probe atomic force microscopy in intermittent contact mode

Complete list of metadata

https://hal-centralesupelec.archives-ouvertes.fr/hal-01798287
Contributor : Frédéric Houzé Connect in order to contact the contributor
Submitted on : Wednesday, May 23, 2018 - 12:34:40 PM
Last modification on : Tuesday, January 4, 2022 - 5:01:05 AM

Identifiers

  • HAL Id : hal-01798287, version 1

Citation

Noëlle Gogneau, Pascal Chrétien, Martina Morassi, Nicoletta Jegenyes, Laetitia Leroy, et al.. Characterization of the piezoelectric-conversion properties of III-Nitride nanowires by conducting probe atomic force microscopy in intermittent contact mode. 4th International Conference on Nanogenerators and Piezotronics (NGPT2018), May 2018, Seoul, South Korea. ⟨hal-01798287⟩

Share

Metrics

Record views

81