Characterization of the piezoelectric-conversion properties of III-Nitride nanowires by conducting probe atomic force microscopy in intermittent contact mode - Archive ouverte HAL Access content directly
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Characterization of the piezoelectric-conversion properties of III-Nitride nanowires by conducting probe atomic force microscopy in intermittent contact mode

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Engineering Sciences [physics] Micro and nanotechnologies/Microelectronics

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Submitted on : Wednesday, May 23, 2018-12:34:40 PM

Last modification on : Monday, October 17, 2022-1:34:39 PM

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hal-01798287 , version 1 (23-05-2018)

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  • HAL Id : hal-01798287 , version 1

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Noëlle Gogneau, Pascal Chrétien, Martina Morassi, Nicoletta Jegenyes, Laetitia Leroy, et al.. Characterization of the piezoelectric-conversion properties of III-Nitride nanowires by conducting probe atomic force microscopy in intermittent contact mode. 4th International Conference on Nanogenerators and Piezotronics (NGPT2018), May 2018, Seoul, South Korea. ⟨hal-01798287⟩

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CNRS CENTRALESUPELEC GEEPS PHEMADIC UNIV-PARIS-SACLAY SORBONNE-UNIVERSITE SU-SCIENCES UP-SCIENCES GS-ENGINEERING INSTITUT-SCIENCES-LUMIERE
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