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Local open-circuit voltage characterization of thin-film radial junction PIN solar cells by Kelvin Probe Force Microscopy

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https://hal-centralesupelec.archives-ouvertes.fr/hal-01801350
Contributor : Jean-Paul Kleider <>
Submitted on : Monday, May 28, 2018 - 2:01:46 PM
Last modification on : Wednesday, September 16, 2020 - 5:51:20 PM

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  • HAL Id : hal-01801350, version 1

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Clément Marchat, Letian Dai, Soumyadeep Misra, Alexandre Jaffré, J Alvarez, et al.. Local open-circuit voltage characterization of thin-film radial junction PIN solar cells by Kelvin Probe Force Microscopy. MRS Spring Meeting 2018, Apr 2018, Phoenix, United States. ⟨hal-01801350⟩

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