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Local open-circuit voltage characterization of thin-film radial junction PIN solar cells by Kelvin Probe Force Microscopy

Clément Marchat 1, 2 Letian Dai 2 Soumyadeep Misra 3 Alexandre Jaffré 2 J Alvarez 2 Alexandra Levtchenko 2 Sylvain Le Gall 2 James P Connolly 2, 1 Martin Foldyna 3 Jean-Paul Kleider 2 Pere Roca I Cabarrocas Roca I Cabarrocas 3 
1 IPVF - Institut Photovoltaïque d’Ile-de-France (ITE)
2 GeePs - Laboratoire Génie électrique et électronique de Paris
3 LPICM - Laboratoire de physique des interfaces et des couches minces [Palaiseau]
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Conference papers
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https://hal-centralesupelec.archives-ouvertes.fr/hal-01801350
Contributor : Jean-Paul KLEIDER Connect in order to contact the contributor
Submitted on : Monday, May 28, 2018 - 2:01:46 PM
Last modification on : Sunday, June 26, 2022 - 5:16:02 AM

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  • HAL Id : hal-01801350, version 1

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Citation

Clément Marchat, Letian Dai, Soumyadeep Misra, Alexandre Jaffré, J Alvarez, et al.. Local open-circuit voltage characterization of thin-film radial junction PIN solar cells by Kelvin Probe Force Microscopy. MRS Spring Meeting 2018, Apr 2018, Phoenix, United States. ⟨hal-01801350⟩

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