Local open-circuit voltage characterization of thin-film radial junction PIN solar cells by Kelvin Probe Force Microscopy - Archive ouverte HAL Access content directly
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Local open-circuit voltage characterization of thin-film radial junction PIN solar cells by Kelvin Probe Force Microscopy

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hal-01801350 , version 1 (28-05-2018)

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  • HAL Id : hal-01801350 , version 1

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Clément Marchat, Letian Dai, Soumyadeep Misra, Alexandre Jaffré, J Alvarez, et al.. Local open-circuit voltage characterization of thin-film radial junction PIN solar cells by Kelvin Probe Force Microscopy. MRS Spring Meeting 2018, Apr 2018, Phoenix, United States. ⟨hal-01801350⟩
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