Investigation of trap states in Gallium Phosphide / Silicon heterojunction devices from capacitance techniques - CentraleSupélec Access content directly
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hal-01801510 , version 1 (28-05-2018)

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  • HAL Id : hal-01801510 , version 1

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Médéric Descazeaux, Delfina Munoz, Arouna Darga, Jean-Paul Kleider. Investigation of trap states in Gallium Phosphide / Silicon heterojunction devices from capacitance techniques. EMRS Spring Meeting 2018, Jun 2018, Strasbourg, France. ⟨hal-01801510⟩
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