Investigation of trap states in Gallium Phosphide / Silicon heterojunction devices from capacitance techniques

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https://hal-centralesupelec.archives-ouvertes.fr/hal-01801510
Contributor : Jean-Paul Kleider <>
Submitted on : Monday, May 28, 2018 - 2:53:00 PM
Last modification on : Thursday, September 12, 2019 - 5:16:02 PM

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  • HAL Id : hal-01801510, version 1

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Médéric Descazeaux, Delfina Munoz, Arouna Darga, Jean-Paul Kleider. Investigation of trap states in Gallium Phosphide / Silicon heterojunction devices from capacitance techniques. EMRS Spring Meeting 2018, Jun 2018, Strasbourg, France. ⟨hal-01801510⟩

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