S. F. Fang, K. Adomi, S. Iyer, H. Morko, H. Zabel et al., J. Appl. Phys, vol.68, p.31, 1990.

C. Renard, T. Molière, N. Cherkashin, J. Alvarez, L. Vincent et al., Sci. Rep, vol.6, p.25328, 2016.

A. M. Ardila, O. Martínez, M. Avella, J. Jiménez, B. Gérard et al., J. Appl. Phys, vol.91, p.5045, 2002.

D. Mencaraglia, Y. L. Bihan, and F. Loëte, Contactless measurement of the conductivity of semiconductors, Patent FR, vol.15, issue.53392

F. Loete, Y. L. Bihan, and D. Mencaraglia, IEEE sensors journal, vol.16, issue.11, pp.4151-4152, 2016.

C. V. Dodd and W. E. Deeds, J. Appl. Phys, vol.39, p.2829, 1968.

Y. P. Varshni, Physica, vol.34, p.149, 1967.

R. Pässler, Phys. Stat. Sol. (b), vol.216, p.975, 1999.

R. Pässler, Phys. Stat. Sol. (b), vol.236, issue.3, p.710, 2003.

E. Grilli, M. Guzzi, R. Zamboni, and L. Pavesi, Phys. Rev. B, vol.45, p.1638, 1992.

S. C. Jain, J. M. Mcgregor, and D. J. Roulston, J. Appl. Phys, vol.68, p.3747, 1990.

O. Madelung, Group III Condensed Matter 41A1b -Group IV Elements, IV-IV and III-V Compounds, p.1174

O. Madelung, Group III Condensed Matter 41A1b -Group IV Elements, IV-IV and III-V Compounds, p.1470

T. Moliere, A. Jaffre, J. Alvarez, D. Mencaraglia, J. P. Connolly et al., J. Appl. Phys, vol.121, p.35704, 2017.

H. Lüth, Solid Surfaces, Interfaces and Thin Films, p.166, 2010.