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Orthorhombic polar Nd-doped BiFeO3 thin film on MgO substrate

Abstract : A Nd-doped BiFeO3 thin film deposited on MgO substrate was studied by synchrotron diffraction. The ferroelectric nature of the film is proven by in-plane remanent polarization measurement. The highest possible symmetry of the film is determined to be orthorhombic, within the Fm2m space group. Such a structure is rotated by 45 degrees with respect to the substrate and is consistent with tilts of oxygen octahedra doubling the unit cell. This polar structure presents a rather unusual strain-accommodation mechanism.
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https://hal-centralesupelec.archives-ouvertes.fr/hal-02186455
Contributor : Amandine Lustrement <>
Submitted on : Wednesday, July 17, 2019 - 12:21:42 PM
Last modification on : Wednesday, July 1, 2020 - 4:22:03 PM

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I. N. Leontyev, Yu I. Yuzyuk, P.-E. Janolin, M. El-Marssi, D. Chernyshov, et al.. Orthorhombic polar Nd-doped BiFeO3 thin film on MgO substrate. Journal of Physics: Condensed Matter, IOP Publishing, 2011, 23 (33), ⟨10.1088/0953-8984/23/33/332201⟩. ⟨hal-02186455⟩

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