Thin ferroelectric Nd-doped BiFeO3 films with orthorhombic structure

I.N. Leontyev (1, 2) , A.S. Anokhin (1) , Y.I. Yuzyuk (1) , Y.I. Golovko (3) , V.M. Mukhortov (3) , D.Y. Chernyshov (4) , V.P. Dmitriev (4) , P.-E. Janolin (2) , Brahim Dkhil (2) , Mimoun El Marssi (5)

1 SFEDU - Southern Federal University [Rostov-on-Don]
2 SPMS - Laboratoire Structures, Propriétés et Modélisation des solides
3 Southern Scientific Center
4 ESRF - European Synchrotron Radiation Facility
5 LPMC - Laboratoire de Physique de la Matière Condensée - UR UPJV 2081

X-ray diffraction and Raman spectroscopy of epitaxial Nd-doped bismuth ferrite films on MgO substrates reveal their orthorhombic symmetry Fmm2 (a = 7.914 Å, b = 7.913 Å, and c = 7.937 Å). © 2010 Allerton Press, Inc.

Mots clés: Bismuth ferrites; MgO substrate; Nd-doped; Orthorhombic structures; Orthorhombic symmetry; Bismuth; Neodymium; Raman spectroscopy; X ray diffraction; Epitaxial films

Domaines: Matériaux

I.N. Leontyev, A.S. Anokhin, Y.I. Yuzyuk, Y.I. Golovko, V.M. Mukhortov, et al.. Thin ferroelectric Nd-doped BiFeO3 films with orthorhombic structure. Bulletin of the Russian Academy of Sciences - Physics, 2010, 74 (8), pp.1112-1114. ⟨10.3103/S1062873810080228⟩. ⟨hal-02269649⟩