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Thin ferroelectric Nd-doped BiFeO3 films with orthorhombic structure

I.N. Leontyev 1, 2 A.S. Anokhin 1 Y.I. Yuzyuk 1 Y.I. Golovko 3 V.M. Mukhortov 3 D.Y. Chernyshov 4 V.P. Dmitriev 4 P.-E. Janolin 2 Brahim Dkhil 2 M. El-Marssi 5
1 SFEDU - Southern Federal University [Rostov-on-Don]
2 SPMS - Laboratoire Structures, Propriétés et Modélisation des solides
3 Southern Scientific Center
4 ESRF - European Synchrotron Radiation Facility
5 EA 2081 - Laboratoire de Physique de la Matière Condensée
Abstract : X-ray diffraction and Raman spectroscopy of epitaxial Nd-doped bismuth ferrite films on MgO substrates reveal their orthorhombic symmetry Fmm2 (a = 7.914 Å, b = 7.913 Å, and c = 7.937 Å). © 2010 Allerton Press, Inc.
Keywords : X ray diffraction Raman spectroscopy Orthorhombic structures Orthorhombic symmetry Bismuth Neodymium Nd-doped MgO substrate Bismuth ferrites Epitaxial films
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https://hal-centralesupelec.archives-ouvertes.fr/hal-02269649
Contributor : Amandine Lustrement <>
Submitted on : Friday, August 23, 2019 - 10:34:08 AM
Last modification on : Tuesday, July 14, 2020 - 11:04:08 AM

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CENTRALESUPELEC | SPMS | CNRS | INC-CNRS | EC-PARIS | SPMS-AXE2

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I.N. Leontyev, A.S. Anokhin, Y.I. Yuzyuk, Y.I. Golovko, V.M. Mukhortov, et al.. Thin ferroelectric Nd-doped BiFeO3 films with orthorhombic structure. Bulletin of the Russian Academy of Sciences Physics, 2010, 74 (8), pp.1112-1114. ⟨10.3103/S1062873810080228⟩. ⟨hal-02269649⟩

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