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Chapitre D'ouvrage Année : 2012

Past, present and future of charge density and density matrix refinements

Résumé

Basic theoretical and some practical aspects of the interpretation of X-ray scattering experiments are described. Our focus is on model building and refinement associated with retrieving information related to electron density matrices from the measured data. The ill-posed nature of this inverse problem is emphasised and the physical significance, reliability and reproducibility of the properties obtained by data fitting are discussed through representative examples taken from recent studies. A special attention is devoted to the pseudoatom formalism widely used to interpret high-resolution single-crystal X-ray diffraction data to map the static electron distribution in solids. © Springer Science+Business Media B.V. 2012.

Dates et versions

hal-02270762 , version 1 (26-08-2019)

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Jean-Michel Gillet, T. Koritsanszky. Past, present and future of charge density and density matrix refinements. Past, present and future of charge density and density matrix refinements, Springer Netherlands, pp.181-211, 2012, 9789048138364; 9789048138357. ⟨10.1007/978-90-481-3836-4_5⟩. ⟨hal-02270762⟩
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