Conference Papers
Year :
Claude Delpha : Connect in order to contact the contributor
https://hal-centralesupelec.archives-ouvertes.fr/hal-02295408
Submitted on : Tuesday, September 24, 2019-10:59:19 AM
Last modification on : Friday, March 24, 2023-2:53:12 PM
Dates and versions
Identifiers
- HAL Id : hal-02295408 , version 1
Cite
Xiaoxia Zhang, Claude Delpha, Demba Diallo. Nondestructive Incipient Crack Detection based on Wavelet and Jensen-Shannon Divergence in the NICA framework. IEEE International Conference on Industrial Electronics (IEEE IECON 2019), Oct 2019, Lisbonne, Portugal. ⟨hal-02295408⟩
Collections
51
View
0
Download