Skip to Main content Skip to Navigation
Journal articles

Recent Progress in Understanding the Properties of the Amorphous Silicon/Crystalline Silicon Interface

Jean-Paul Kleider 1 José Alvarez 1 Rudolf Brüggemann 1 Marie-Estelle Gueunier-Farret 1
1 GeePs - Laboratoire Génie électrique et électronique de Paris
Document type :
Journal articles
Complete list of metadata

Cited literature [67 references]  Display  Hide  Download
https://hal-centralesupelec.archives-ouvertes.fr/hal-02308332
Contributor : Jean-Paul Kleider <>
Submitted on : Thursday, March 19, 2020 - 8:07:15 PM
Last modification on : Tuesday, July 20, 2021 - 3:03:51 AM
Long-term archiving on: : Saturday, June 20, 2020 - 4:41:27 PM

File

Vignette du document
Kleider_pssa_2019_1800877.pdf
Explicit agreement for this submission

Identifiers

Collections

CNRS | SU-SCIENCES | SORBONNE-UNIVERSITE | PHEMADIC | GEEPS | CENTRALESUPELEC | SU-TI | GS-ENGINEERING

Citation

Jean-Paul Kleider, José Alvarez, Rudolf Brüggemann, Marie-Estelle Gueunier-Farret. Recent Progress in Understanding the Properties of the Amorphous Silicon/Crystalline Silicon Interface. physica status solidi (a), Wiley, 2019, 216 (13), pp.1800877. ⟨10.1002/pssa.201800877⟩. ⟨hal-02308332⟩

Export

BibTeX TEI DC DCterms EndNote

Share

Metrics

Record views

351

Files downloads

967