Recent Progress in Understanding the Properties of the Amorphous Silicon/Crystalline Silicon Interface - Archive ouverte HAL Access content directly
Journal Articles physica status solidi (a) Year : 2019

Dates and versions

hal-02308332 , version 1 (19-03-2020)

Identifiers

Cite

Jean-Paul Kleider, José Alvarez, Rudolf Brüggemann, Marie-Estelle Gueunier-Farret. Recent Progress in Understanding the Properties of the Amorphous Silicon/Crystalline Silicon Interface. physica status solidi (a), 2019, 216 (13), pp.1800877. ⟨10.1002/pssa.201800877⟩. ⟨hal-02308332⟩
75 View
214 Download

Altmetric

Share

Gmail Facebook Twitter LinkedIn More