P. Y. Rosenwaks, S. Saraf, O. Tal, A. Schwarzman, D. T. Glatzel et al., Kelvin probe force microscopy of semiconductors, in Scanning Probe Microscopy, pp.663-689, 2007.

P. Narchi, Cross-sectional investigations on epitaxial silicon solar cells by kelvin and conducting probe atomic force microscopy: effect of illumination, Nanosc. Res. Lett, vol.11, p.55, 2016.
URL : https://hal.archives-ouvertes.fr/hal-01238543

L. Kronik, Surface photovoltage spectroscopy of semiconductor structures: at the crossroads of physics, chemistry and electrical engineering, Surf. Interface Anal, vol.31, p.954, 2001.

V. Donchev, Surface photovoltage phase spectroscopy À a handy tool for characterisation of bulk semiconductors and nanostructures, Mater. Sci. Eng. B, vol.129, p.186, 2006.

V. Donchev, A surface photovoltage spectroscopy system used for minority carrier diffusion length measurements on floating zone silicon, J. Optoelectr. Adv. Mater, vol.7, p.533, 2015.

S. Inc, ATLAS user's manual, 2012.

Y. Huang, A new approach to modelling Kelvin probe force microscopy of hetero-structures in the dark and under illumination, Opt. Quant. Electr, vol.50, p.41, 2018.
URL : https://hal.archives-ouvertes.fr/hal-01675806

R. C. Newman, Defects in silicon, Rep. Prog. Phys, vol.45, p.1163, 1982.

B. Stegemann, Passivation of Crystalline Silicon Wafers by Ultrathin Oxide Layers: Comparison of Wetchemical, Plasma and Thermal Oxidation Techniques, IEEE 7th World Conference on Photovoltaic Energy Conversion, 2018.

C. Marchat, J. P. Connolly, J. Kleider, J. Alvarez, and L. J. Koduvelikulathu, Jean Baptiste Puel, KPFM surface photovoltage measurement and numerical simulation, EPJ Photovoltaics, vol.10, 2019.