Kelvin probe force microscopy of semiconductors, in Scanning Probe Microscopy, pp.663-689, 2007. ,
Cross-sectional investigations on epitaxial silicon solar cells by kelvin and conducting probe atomic force microscopy: effect of illumination, Nanosc. Res. Lett, vol.11, p.55, 2016. ,
URL : https://hal.archives-ouvertes.fr/hal-01238543
Surface photovoltage spectroscopy of semiconductor structures: at the crossroads of physics, chemistry and electrical engineering, Surf. Interface Anal, vol.31, p.954, 2001. ,
Surface photovoltage phase spectroscopy À a handy tool for characterisation of bulk semiconductors and nanostructures, Mater. Sci. Eng. B, vol.129, p.186, 2006. ,
A surface photovoltage spectroscopy system used for minority carrier diffusion length measurements on floating zone silicon, J. Optoelectr. Adv. Mater, vol.7, p.533, 2015. ,
ATLAS user's manual, 2012. ,
A new approach to modelling Kelvin probe force microscopy of hetero-structures in the dark and under illumination, Opt. Quant. Electr, vol.50, p.41, 2018. ,
URL : https://hal.archives-ouvertes.fr/hal-01675806
Defects in silicon, Rep. Prog. Phys, vol.45, p.1163, 1982. ,
Passivation of Crystalline Silicon Wafers by Ultrathin Oxide Layers: Comparison of Wetchemical, Plasma and Thermal Oxidation Techniques, IEEE 7th World Conference on Photovoltaic Energy Conversion, 2018. ,
Jean Baptiste Puel, KPFM surface photovoltage measurement and numerical simulation, EPJ Photovoltaics, vol.10, 2019. ,