Laurent Tranchant, Jose Ordonez-Miranda, Taihei Matsumoto, Sergei Gluchko, Thomas Antoni, et al.. Measurement of the in-plane thermal conductivity of SiO2 thin films due to surface phonon-polaritons.
21st International Workshop on Thermal Investigations of ICs and Systems, THERMINIC, Sep 2015, Paris, France.
⟨10.1109/THERMINIC.2015.7389595⟩.
⟨hal-02333418⟩