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Halide Perovskite Thin Films Characterisation by Force Microscopy Techniques

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https://hal-centralesupelec.archives-ouvertes.fr/hal-02344010
Contributor : Jean-Paul Kleider <>
Submitted on : Sunday, November 3, 2019 - 6:48:18 PM
Last modification on : Tuesday, September 22, 2020 - 3:38:23 AM

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  • HAL Id : hal-02344010, version 1

Citation

Aleksandra Bojar, Clément Marchat, J. Alvarez, Philip Schulz, Jean-Paul Kleider. Halide Perovskite Thin Films Characterisation by Force Microscopy Techniques. 28th International Conference on Amorphous and nanocrystalline Semiconductors (ICANS 28), Aug 2019, Palaiseau, France. ⟨hal-02344010⟩

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