Halide Perovskite Thin Films Characterisation by Force Microscopy Techniques

Physics [physics] Condensed Matter [cond-mat] Materials Science [cond-mat.mtrl-sci] Engineering Sciences [physics] Micro and nanotechnologies/Microelectronics Engineering Sciences [physics] Electric power Engineering Sciences [physics] Optics / Photonic Engineering Sciences [physics] Materials

Jean-Paul KLEIDER : Connect in order to contact the contributor

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Submitted on : Sunday, November 3, 2019-6:48:18 PM

Last modification on : Sunday, June 26, 2022-2:42:32 AM

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hal-02344010 , version 1 (03-11-2019)

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HAL Id : hal-02344010 , version 1

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Aleksandra Bojar, Clément Marchat, J. Alvarez, Philip Schulz, Jean-Paul Kleider. Halide Perovskite Thin Films Characterisation by Force Microscopy Techniques. 28th International Conference on Amorphous and nanocrystalline Semiconductors (ICANS 28), Aug 2019, Palaiseau, France. ⟨hal-02344010⟩

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