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Poster communications

Halide Perovskite Thin Films Characterisation by Force Microscopy Techniques

Aleksandra Bojar 1 Clément Marchat 2, 1 J. Alvarez 1, 2 Philip Schulz 3, 2 Jean-Paul Kleider 1 
1 GeePs - Laboratoire Génie électrique et électronique de Paris
2 IPVF - Institut Photovoltaïque d’Ile-de-France (UMR)
3 CNRS - Centre National de la Recherche Scientifique
Document type :
Poster communications
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https://hal-centralesupelec.archives-ouvertes.fr/hal-02344010
Contributor : Jean-Paul KLEIDER Connect in order to contact the contributor
Submitted on : Sunday, November 3, 2019 - 6:48:18 PM
Last modification on : Sunday, June 26, 2022 - 2:42:32 AM

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  • HAL Id : hal-02344010, version 1

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Citation

Aleksandra Bojar, Clément Marchat, J. Alvarez, Philip Schulz, Jean-Paul Kleider. Halide Perovskite Thin Films Characterisation by Force Microscopy Techniques. 28th International Conference on Amorphous and nanocrystalline Semiconductors (ICANS 28), Aug 2019, Palaiseau, France. ⟨hal-02344010⟩

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