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Halide Perovskite Thin Films Characterisation by Force Microscopy Techniques

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hal-02344010 , version 1 (03-11-2019)

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  • HAL Id : hal-02344010 , version 1

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Aleksandra Bojar, Clément Marchat, J. Alvarez, Philip Schulz, Jean-Paul Kleider. Halide Perovskite Thin Films Characterisation by Force Microscopy Techniques. 28th International Conference on Amorphous and nanocrystalline Semiconductors (ICANS 28), Aug 2019, Palaiseau, France. ⟨hal-02344010⟩
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