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Halide Perovskite Thin Films Characterisation by Force Microscopy Techniques

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Materials Science [cond-mat.mtrl-sci] Micro and nanotechnologies/Microelectronics Electric power Optics / Photonic Materials

Jean-Paul KLEIDER  : Connect in order to contact the contributor

https://hal-centralesupelec.archives-ouvertes.fr/hal-02344010

Submitted on : Sunday, November 3, 2019-6:48:18 PM

Last modification on : Friday, June 2, 2023-3:14:53 PM

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hal-02344010 , version 1 (03-11-2019)

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  • HAL Id : hal-02344010 , version 1

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Aleksandra Bojar, Clément Marchat, J. Alvarez, Philip Schulz, Jean-Paul Kleider. Halide Perovskite Thin Films Characterisation by Force Microscopy Techniques. 28th International Conference on Amorphous and nanocrystalline Semiconductors (ICANS 28), Aug 2019, Palaiseau, France. ⟨hal-02344010⟩

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