Conducted EMI prediction using different levels of MOSFET models in a multi-physics optimizations context

Abstract : This paper proposes a modeling methodology for the prediction of conducted EMI in the context of multi-physics optimizations. The study of the well-known DC-DC buck converter is chosen as illustration to validate this procedure. A bottom-up approach is used to model the entire structure. The modeling of switching cell, passive elements and also Printed Circuit Board (PCB) is presented. Models validation by comparison with experimental results helps to estimate the influence of each model on the accuracy of results.