Conducted EMI prediction using different levels of MOSFET models in a multi-physics optimizations context

Mohamed Toure (1) , Françoise Paladian (1) , Jad Taki (2) , Pierre-Etienne Lévy (2) , Florent Robert (3, 2) , Mohamed Bensetti (2) , Laurent Dufour (3)

1 IP - Institut Pascal
2 GeePs - Laboratoire Génie électrique et électronique de Paris
3 EFi Automotive - Service Recherche Avancée

This paper proposes a modeling methodology for the prediction of conducted EMI in the context of multi-physics optimizations. The study of the well-known DC-DC buck converter is chosen as illustration to validate this procedure. A bottom-up approach is used to model the entire structure. The modeling of switching cell, passive elements and also Printed Circuit Board (PCB) is presented. Models validation by comparison with experimental results helps to estimate the influence of each model on the accuracy of results.

Domaines: Sciences de l'ingénieur [physics]

Mohamed Toure, Françoise Paladian, Jad Taki, Pierre-Etienne Lévy, Florent Robert, et al.. Conducted EMI prediction using different levels of MOSFET models in a multi-physics optimizations context. 2016 International Conference on Electrical Sciences and Technologies in Maghreb (CISTEM), Oct 2016, Marrakech, Morocco. pp.1-5, ⟨10.1109/CISTEM.2016.8066791⟩. ⟨hal-02401656⟩