Growth and characterization of CuO thin films prepared by spray pyrolysis with various precursors

Abderrahim Moumen (1) , Bouchaib Hartiti (1) , Salah Fadili (1) , Philippe Thevenin (2) , Maryam Siadat (2)

1 MAC & PM Laboratory, ANEPMAER Group, FSTM
2 LCOMS - Laboratoire de Conception, Optimisation et Modélisation des Systèmes

in In this work, we study the effect or the different copper precursors on the structural optical and electrical properties of CuO thin films deposited on glass substrates using spray pyrolysis technique, the phase of tenorite (CuO) are identified using X-Ray diffraction. A single phase without impurities is observed for the three precursors. The band gap energy and others optical parameters are calculated using absorbance/transmittance data giving by spectrophotometry. The semiconductor aspect of our films are showed by four probes method. © 2016 IEEE.

Keywords: CuO; Dielectric constant; Gap; Refractive index; Thin films; XRD

Domains: Engineering Sciences [physics]

Abderrahim Moumen, Bouchaib Hartiti, Salah Fadili, Philippe Thevenin, Maryam Siadat. Growth and characterization of CuO thin films prepared by spray pyrolysis with various precursors. 2016 International Renewable and Sustainable Energy Conference, IRSEC 2016, Nov 2016, Marrakech, Morocco. pp.26-30, ⟨10.1109/IRSEC.2016.7984068⟩. ⟨hal-02434087⟩