Incipient fault detection and estimation based on Jensen–Shannon divergence in a data-driven approach

Xiaoxia Zhang (1) , Claude Delpha (1) , Demba Diallo (2)

1 L2S - Laboratoire des signaux et systèmes
2 GeePs - Laboratoire Génie électrique et électronique de Paris

Domains: Engineering Sciences [physics]; Signal and Image processing

Xiaoxia Zhang, Claude Delpha, Demba Diallo. Incipient fault detection and estimation based on Jensen–Shannon divergence in a data-driven approach. Signal Processing, 2020, 169, pp.107410. ⟨10.1016/j.sigpro.2019.107410⟩. ⟨hal-02903335⟩