Journal Articles
IEEE Access
Year : 2020
Claude Delpha : Connect in order to contact the contributor
https://hal-centralesupelec.archives-ouvertes.fr/hal-02903353
Submitted on : Tuesday, July 21, 2020-3:10:17 AM
Last modification on : Wednesday, March 16, 2022-3:54:05 AM
Cite
Xiaoxia Zhang, Claude Delpha, Demba Diallo. Jensen-Shannon Divergence for Non-Destructive Incipient Crack Detection and Estimation. IEEE Access, 2020, 8, pp.116148-116162. ⟨10.1109/ACCESS.2020.3004658⟩. ⟨hal-02903353⟩
Collections
47
View
0
Download