Journal Articles
IEEE Access
Year : 2020
Claude Delpha : Connect in order to contact the contributor
https://hal-centralesupelec.archives-ouvertes.fr/hal-02903353
Submitted on : Tuesday, July 21, 2020-3:10:17 AM
Last modification on : Friday, March 24, 2023-2:53:18 PM
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Xiaoxia Zhang, Claude Delpha, Demba Diallo. Jensen-Shannon Divergence for Non-Destructive Incipient Crack Detection and Estimation. IEEE Access, 2020, 8, pp.116148-116162. ⟨10.1109/ACCESS.2020.3004658⟩. ⟨hal-02903353⟩
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