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Conference poster

Two-Photon luminescence microscopy for depth profiling of photovoltaic materials

Alexandre Jaffré 1, 2 J Alvarez Jean-Paul Kleider 
1 GeePs - Laboratoire Génie électrique et électronique de Paris
2 IPVF - Institut Photovoltaïque d’Ile-de-France (ITE)
Document type :
Conference poster
Complete list of metadata
https://hal-centralesupelec.archives-ouvertes.fr/hal-03246749
Contributor : Alexandre Jaffré Connect in order to contact the contributor
Submitted on : Wednesday, June 2, 2021 - 3:28:09 PM
Last modification on : Sunday, June 26, 2022 - 3:08:59 AM

Identifiers

  • HAL Id : hal-03246749, version 1

Collections

CNRS | CENTRALESUPELEC | GEEPS | UNIV-PARIS-SACLAY | SORBONNE-UNIVERSITE | SU-SCIENCES | GEEPS-MATERIAU | GS-ENGINEERING | INSTITUT-SCIENCES-LUMIERE

Citation

Alexandre Jaffré, J Alvarez, Jean-Paul Kleider. Two-Photon luminescence microscopy for depth profiling of photovoltaic materials. Journées Nationales du Photovoltaique, Jan 2021, DOURDAN, France. ⟨hal-03246749⟩

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