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Development of an AFM-based technique for extended write/erase endurance measurements of memristive cells

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https://hal-centralesupelec.archives-ouvertes.fr/hal-03288209
Contributor : Olivier Schneegans Connect in order to contact the contributor
Submitted on : Friday, July 16, 2021 - 11:18:52 AM
Last modification on : Friday, August 5, 2022 - 12:00:10 PM

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  • HAL Id : hal-03288209, version 1

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Van Huy Mai, Van Son Nguyen, Pascale Auban Senzier, Claude Pasquier, Kang Wang, et al.. Development of an AFM-based technique for extended write/erase endurance measurements of memristive cells. Nanotech France 2021, Jun 2021, Paris (virtual mode), France. ⟨hal-03288209⟩

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