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Development of an AFM-based technique for extended write/erase endurance measurements of memristive cells

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hal-03288209 , version 1 (16-07-2021)

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  • HAL Id : hal-03288209 , version 1

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Van Huy Mai, Van Son Nguyen, Pascale Auban Senzier, Claude Pasquier, Kang Wang, et al.. Development of an AFM-based technique for extended write/erase endurance measurements of memristive cells. Nanotech France 2021, Jun 2021, Paris (virtual mode), France. ⟨hal-03288209⟩
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