Development of an AFM-based technique for extended write/erase endurance measurements of memristive cells

Van Huy Mai (1) , Van Son Nguyen (2) , Pascale Auban Senzier (3) , Claude Pasquier (3) , Kang Wang (3) , Marcelo J Rozenberg (3) , John Giapintzakis (4) , Evripides Kyriakides (4) , Thomas Maroutian (5) , Guillaume Agnus (5) , Philippe Lecoeur (5) , Ngoc Anh Nguyen (6) , Sami Oukassi (6) , Raphaël Salot (6) , David Alamarguy (7) , Pascal Chrétien (7) , Jean- Christophe Lacroix (8) , Olivier Schneegans (7)

1 LQDTU - Le Quy Don Technical University
2 INES - Institut National de L'Energie Solaire
3 LPS - Laboratoire de Physique des Solides
4 UCY - University of Cyprus [Nicosia]
5 C2N - Centre de Nanosciences et de Nanotechnologies
6 CEA-LETI - Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information
7 GeePs - Laboratoire Génie électrique et électronique de Paris
8 ITODYS (UMR_7086) - Interfaces, Traitements, Organisation et Dynamique des Systèmes

Domains: Engineering Sciences [physics]; Materials; Engineering Sciences [physics]; Micro and nanotechnologies/Microelectronics; Physics [physics]; Condensed Matter [cond-mat]; Materials Science [cond-mat.mtrl-sci]

Van Huy Mai, Van Son Nguyen, Pascale Auban Senzier, Claude Pasquier, Kang Wang, et al.. Development of an AFM-based technique for extended write/erase endurance measurements of memristive cells. Nanotech France 2021, Jun 2021, Paris (virtual mode), France. ⟨hal-03288209⟩