HAL will be down for maintenance from Friday, June 10 at 4pm through Monday, June 13 at 9am. More information
Skip to Main content Skip to Navigation
Conference papers

Development of an AFM-based technique for extended write/erase endurance measurements of memristive cells

Complete list of metadata

https://hal-centralesupelec.archives-ouvertes.fr/hal-03288209
Contributor : Olivier Schneegans Connect in order to contact the contributor
Submitted on : Friday, July 16, 2021 - 11:18:52 AM
Last modification on : Thursday, April 7, 2022 - 1:58:26 PM

Identifiers

  • HAL Id : hal-03288209, version 1

Citation

Van Mai, Van Nguyen, Pascale Senzier, Claude Pasquier, Kang Wang, et al.. Development of an AFM-based technique for extended write/erase endurance measurements of memristive cells. Nanotech France 2021, Jun 2021, Paris (virtual mode), France. ⟨hal-03288209⟩

Share

Metrics

Record views

85

Files downloads

18