Electrically driven transient and permanent phase transformations in highly strained epitaxial BiFeO 3 thin films

Hyeon Jun Lee (1) , Jeongyong Kim (2) , Seung Hyun Hwang (1) , Hyeokmin Choe (3) , Semen Gorfman (4) , Yeong-Jae Heo (1) , Su Yong Lee (5) , Pierre-Eymeric Janolin (6) , Igor Kornev (6) , Tobias Schülli (7) , Carsten Richter (7) , Joo-Hyoung Lee (1) , Ullrich Pietsch (8) , Chan-Ho Yang (2) , Ji Young Jo (2)

1 GIST - Gwangju Institute of Science and Technology
2 KAIST - Korea Advanced Institute of Science and Technology
3 NIST - National Institute of Standards and Technology [Gaithersburg]
4 TAU - Tel Aviv University
5 POSTECH - Pohang University of Science and Technology
6 SPMS - Laboratoire Structures, Propriétés et Modélisation des solides
7 ESRF - European Synchrotron Radiation Facility [Grenoble]
8 Department of Physics, University of Siegen Emmy-Noether-Campus , Walter-Flex-Str. 3, Siegen 57072, Germany

Domaines: Physique [physics]

Hyeon Jun Lee, Jeongyong Kim, Seung Hyun Hwang, Hyeokmin Choe, Semen Gorfman, et al.. Electrically driven transient and permanent phase transformations in highly strained epitaxial BiFeO 3 thin films. APL Materials, 2020, 8 (10), pp.101110. ⟨10.1063/5.0025673⟩. ⟨hal-03365837⟩