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Electrical characterization of PA-MBE grown GaN nanowires via conductive probe AFM - Effect of load and generator resistances

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Conference papers
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https://hal-centralesupelec.archives-ouvertes.fr/hal-03844452
Contributor : Frédéric Houzé Connect in order to contact the contributor
Submitted on : Tuesday, November 8, 2022 - 5:11:17 PM
Last modification on : Thursday, November 10, 2022 - 3:31:23 AM

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  • HAL Id : hal-03844452, version 1

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Tanbir Sodhi, Pascal Chrétien, Laurent Travers, Frédéric Houzé, Noëlle Gogneau. Electrical characterization of PA-MBE grown GaN nanowires via conductive probe AFM - Effect of load and generator resistances. Summer School of the GDR-PULSE network, Jul 2021, Porquerolles, France. ⟨hal-03844452⟩

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