Electrical characterization of PA-MBE grown GaN nanowires via conductive probe AFM - Effect of load and generator resistances - Archive ouverte HAL

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Electrical characterization of PA-MBE grown GaN nanowires via conductive probe AFM - Effect of load and generator resistances

(1) , (2) , (1) , (2) , (1)

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Tanbir Sodhi

Function : Author
PersonId : 182368
IdHAL : tanbir-kaur-sodhi

Centre de Nanosciences et de Nanotechnologies

Pascal Chrétien

Function : Author
PersonId : 5981
IdHAL : pascal-chretien

Laboratoire Génie électrique et électronique de Paris

Laurent Travers

Function : Author

Centre de Nanosciences et de Nanotechnologies

Frédéric Houzé

Function : Author
PersonId : 13067
IdHAL : frederic-houze
ORCID : 0000-0001-8054-3184
IdRef : 15620584X

Laboratoire Génie électrique et électronique de Paris

Noëlle Gogneau

Function : Author
PersonId : 180106
IdHAL : noelle-gogneau
ORCID : 0000-0002-4881-1617
IdRef : 084148020

Centre de Nanosciences et de Nanotechnologies

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Engineering Sciences [physics]

Frédéric Houzé : Connect in order to contact the contributor

https://hal-centralesupelec.archives-ouvertes.fr/hal-03844452

Submitted on : Tuesday, November 8, 2022-5:11:17 PM

Last modification on : Thursday, March 9, 2023-10:30:17 AM

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hal-03844452 , version 1 (08-11-2022)

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HAL Id : hal-03844452 , version 1

Cite

Tanbir Sodhi, Pascal Chrétien, Laurent Travers, Frédéric Houzé, Noëlle Gogneau. Electrical characterization of PA-MBE grown GaN nanowires via conductive probe AFM - Effect of load and generator resistances. Summer School of the GDR-PULSE network, Jul 2021, Porquerolles, France. ⟨hal-03844452⟩

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CNRS CENTRALESUPELEC GEEPS UNIV-PARIS-SACLAY SORBONNE-UNIVERSITE SU-SCIENCES GS-PHYSIQUE C2N

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