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, Aucun lien avec les pinholes n'a pu être confirmé, ce qui démontre que la technique c-AFM est inadaptée pour certains échantillons notamment lorsque les couches étudiées possèdent une très bonne conduction latérale. Les résultats de la partie 5.5 ont confirmé que, sur ces mêmes échantillons, les mesures de KPFM permettent de mettre en évidence des inhomogénéités visibles uniquement lorsqu'un oxyde de passivation est présent dans la structure, ce qui rend très probable leur lien avec les pinholes. La raison pourrait être une augmentation locale de la concentration de dopants apparue en conséquence de la formation des pinholes et de la présence d'effets d'accumulation au interfaces poly-Si/c-Si de ces derniers, Les résultats de la partie 5.4 de ce chapitre ont montré que les mesures de c-AFM étaient principalement sensibles à des inhomogénéités en surface de la couche de poly-Si
, intrinsèque, l'idée étant de minimiser la conduction latérale qui était fortement présente pour les échantillons précédents. La technique c-AFM a donc de nouveau été choisie et couplée aux mesures de KPFM dans le but d'y mener des mesures corrélatives pour les mêmes zones cartographiées. L'échantillon étudié est celui de la série 3624
, en a) et la cartographie de courant en b) obtenues par mesure de c-AFM à l'aide du Résiscope sous une polarisation de 0,1 V en inverse. Au premier abord, la plus faible conductivité de la couche de poly-Si ne semble pas avoir modifié la densité des chemins de conduction et des pics de courant. Ceci nous amène donc à cartographier la même zone avec l'approche KPFM. La principale problématique rencontrée afin de comparer deux cartographies obtenues par différentes techniques est de pouvoir s'assurer de mesurer la même zone. Figure 69 : Cartographies : a) de hauteur, et b) de courant réalisées par c-AFM à l'aide du Résiscope sur l'échantillon de contact passivant avec une couche de poly-Si intrinsèque recuit à 800°C. Les cartographies ont été réalisées après désoxydation de la surface par HF, Les mesures de c-AFM sont présentées dans la Figure 69 qui montre la topographie
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Annexe 1 : modélisation I. Simulation de diffusion pendant le recuit de structures, 2012. ,
, Pour ces simulations, une structure 2D, similaire à la Figure 51.a et représentant la structure finale des échantillons, a été utilisée pour observer la diffusion en présence d'une ouverture dans l'oxyde. Les dimensions et caractéristiques des couches de cette structure sont celles de la série GeePs 52 avec, pour rappel, une couche de poly-Si d'épaisseur 15 nm et de dopage type p (B) de 10 20 cm -3 , une couche d'oxyde de passivation d'épaisseur 1,4 nm et un substrat en silicium de dopage de type n de 10 15 cm -3 . Le pinhole est représenté par un trou dans la couche d'oxyde ayant un diamètre de 10 nm. Concernant les conditions du processus de diffusion, la simulation a reproduit le recuit subi par les échantillons avec une durée de 30 minutes et une température de 800°C, Afin de vérifier le gradient de dopage auquel on peut s'attendre suite au recuit à haute température subi par les échantillons de contact passivant
, Cette observation amène un questionnement sur le dopage réel du poly-Si à température ambiante dans les échantillons expérimentaux. Dans le cas des simulations, il apparaît une autre question de l'effet de cette limite de solubilité sur le gradient de dopage observé dans la couche de poly-Si près du pinhole et s'il peut être considéré comme représentatif de l'effet de la diffusion. Si l'on observe les profondeurs de diffusion du tracé d, on a : à 700°C, une diffusion de 4x10 16 cm -3 de dopants à une profondeur de 10 nm de l'interface poly-Si/c-Si; à 800°C, une diffusion de 5x10 17 cm -3 à une profondeur de 26 nm de l'interface poly-Si/c-Si; à 900°C, une diffusion de 10 15 cm -3 à une profondeur de 128 nm, montrant la distribution des dopants suite à la diffusion qui a eu lieu pendant des recuits à 700°C, 800°C et 900°C, respectivement. Les graphes d et e de la Figure A.72 sont des tracés de profil de dopage en bore en profondeur au niveau d'un pinhole et à travers l'oxyde luimême respectivement
Simulations de diffusion dans le cas d'une structure similaire au contact passivant avec une couche en poly-Si dopé p (10 19 cm -3 ) et la présence d, vol.74 ,
, Le paramètre de temps de diffusion simulé est de 30 minutes comme pour le recuit des échantillons. Les valeurs de température utilisées sont, elles aussi, celles des recuits des échantillons: a) 700°C, b) 800°C, c) 900°C. La figure d) montre le profil de dopage en bore à la surface de la couche de poly-Si autour d'un trou dans l'oxyde après diffusion pour les trois températures de recuit
, Simulation de diffusion pendant le recuit de structures
, En raison de cette contamination possible, nous avons considéré un dopage résiduel de type n d'un niveau de 10 13 cm -3 . Dans ce cas, après une diffusion de 30 minutes à 800°C, on peut voir sur la Figure A.75 l'apparition d'un dopage n plus important au-dessus du trou dans l'oxyde, qui forme un gradient s'étendant sur une largeur d'environ 100 nm. Ce dopage local plus important mène à la présence d'une résistivité locale plus faible pouvant potentiellement expliquer les pics de courant observés expérimentalement dans la partie 5.6. La présence de ce, Les simulations ont aussi été effectuées dans le cas d'une structure possédant une couche de poly-Si de faible dopage, ceci afin de représenter l'échantillon expérimental avec une couche de poly-Si intrinsèque
Ce gradient de travail de sortie ne peut cependant pas expliquer les puits de CPD car étant en sens opposé. Concernant l'autre cas où la couche poly-Si intrinsèque est considérée comme ayant un léger dopage (10 13 cm -3 ) de type p, les résultats de simulation sont similaires (augmentation local du dopage total et sens de variation du CPD) avec comme seule différence notable ,
Simulations de diffusion dans le cas d'une structure similaire au contact passivant avec une couche en poly-Si dopé n à 10 13 cm -3 , simulant un dépôt intrinsèque avec une faible contamination, et la présence d'un trou de 10 nm dans la couche d'oxyde. Le paramètre de temps de diffusion simulé est de 30 minutes comme pour le recuit des échantillons. La valeur de température de diffusion utilisée est de 800°C. A gauche, concentration en dopant phosphore dans la structure après diffusion, à droite, tracé suivant la flèche noire en surface du poly-Si de la valeur |E F -E C | (courbe verte, vol.75 ,
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Local V OC Measurements by Kelvin Probe Force Microscopy Applied on P-I-N Radial Junction Si Nanowires, Nanoscale Res. Lett, vol.14, p.398, 2019. ,
Electrical Scanning Probe Microscopy Approaches to Investigate Solar Cell Junctions and Devices, In Quantum Sensing and Nano Electronics and Photonics XVII, International Society for Optics and Photonics, vol.11288, 2020. ,
, Conférences internationales (I)
Improvement of the conductivity and surface passivation properties of boron-doped poly-silicon on oxide, 8th International Conference on Crystalline Silicon Photovoltaics, 2018. ,
URL : https://hal.archives-ouvertes.fr/hal-01943223
Pere Roca i Cabarrocas, Local Open-Circuit Voltage Characterization of Thin-Film Radial Junction PIN Solar Cells by Kelvin Probe Force Microscopy, MRS 2018 Spring Meeting, Symposium CM01-Exploring Nanoscale Physical Properties of Materials via Local Probes, 2018. ,
Conductivity and surface passivation of boron-doped poly-silicon passivated contacts for crystalline silicon solar cells, E-MRS 2018 Spring Meeting, Symposium I-Materials research for group IV semiconductors: growth, characterization and technological developments, 2018. ,
, Passivated Selective Contact Structure Characterizationby C-AFM and KPFM of the Conduction by Pinholes, ICANS 28 : Amorphous and nanocrystalline semiconductors, 2019.
Halide Perovskite Thin Films Characterisation by Force Microscopy Techniques, ICANS 28 : Amorphous and nanocrystalline semiconductors, 2019. ,
, Si/SiOx/c-Si Passivated Contact Structure, EU PVSEC 2019, 36th European Photovoltaic Solar Energy Conference, Sep. 9 th -12 th, 2019.
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Functionalized Oxides for Bifacial Solar Cells with Passivated Contacts: First Results of the OXYGEN Project, EU PVSEC 2019, 36th European Photovoltaic Solar Energy Conference, 2019. ,
Electrical Scanning Probe Microscopy Approaches to Investigate Solar Cell Junctions and Devices, SPIE OPTO PHOTONIC WEST, Quantum Sensing and Nano Electronics and Photonics XVII, 2020. ,
Cartographie du photo-courant sur des jonctions à contact passivant en silicium poly-cristallin sur oxide, Journées Nationales, 2017. ,
Numerical analysis of kelvin probe force microscopy, JNPV 2017, Journées Nationales du photovoltaique 2017, 2017. ,
URL : https://hal.archives-ouvertes.fr/hal-01633187
Caractérisation du potentiel de circuit-ouvert d'une cellule solaire Si à jonction radiale PIN en couche mince par la technique de Kelvin Probe Force Microscopy, Journées Nationales, 2018. ,
Parametric analysis of KPFM by numerical simulation, Journées Nationales, 2018. ,
URL : https://hal.archives-ouvertes.fr/hal-01943490