Dual Detection of Heating and Photocurrent attacks (DDHP) Sensor using Hybrid CMOS/STT-MRAM

M. Kharbouche-Harrari , R. Wacquez (1) , G. Di Pendina (2) , J.-M. Dutertre (3) , J. Postel-Pellerin (4) , D. Aboulkassimi (1) , J.-M. Portal (4)

1 DSUD - CEA Tech en région Sud
2 SPINTEC - SPINtronique et TEchnologie des Composants
3 ERC CEA / EMSE - Équipe de Recherche Commune CEA - EMSE (SESAM : Secured Embedded Systems And Microelectronics)
4 IM2NP - Institut des Matériaux, de Microélectronique et des Nanosciences de Provence

Integrated Circuits (ICs) have to be protected against threatening environmental radiations and malicious perturbations. A large panel of countermeasures has been developed to answer the needs of this challenging field. The Bulk Built-In Current Sensor (BBICS) is a highly reliable solution for the detection of these abnormal transient radiations that could induce a transient current in the Front-End of Line (FEoL). This paper proposes an innovative sensor based on the BBICS associated to the power-efficient emerging non-volatile memory Spin Transfer Torque Magnetic Random Access Memory (STT-MRAM). The goal of this security solution is to detect both possible photoelectrical laser injections and thermal perturbations. Thus, the proposed architecture designated by Dual Detection of Heating and Photocurrent attacks (DDHP) highlights a dual detection efficiency, on the CMOS circuitry and on the Back-End of Line (BEoL) STT-MRAM technology.

Mots clés: DDHP; BBICS; STT-MRAM; laser attack; sensor; DDHP

Domaines: Micro et nanotechnologies/Microélectronique

M. Kharbouche-Harrari, R. Wacquez, G. Di Pendina, J.-M. Dutertre, J. Postel-Pellerin, et al.. Dual Detection of Heating and Photocurrent attacks (DDHP) Sensor using Hybrid CMOS/STT-MRAM. 2019 IEEE 25th International Symposium on On-Line Testing And Robust System Design (IOLTS), Jul 2019, Rhodes, France. pp.322-327, ⟨10.1109/IOLTS.2019.8854374⟩. ⟨hal-03753415⟩