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Mots clés
Stable isotopic tracing
Nickel
Gold
Diffusion
Auger electron spectroscopy AES
AC susceptibility
Sputtering
Hysteresis
3C-SiC
XPS
Pulsed laser deposition
Transparent conductive oxide TCO
8140Ef
17Op
Kossel diffraction
6855Jk
Epitaxial growth
XRD
Defects
Atomic Layer Deposition ALD
15N
Nuclear resonance profiling NRP
Magnetic anisotropy
18O
Magnetic semiconductors
Ion implantation
Al2O3
PIXE
27Ald p&α
Pb centers
RBS
Adsorption Isotherms
Passivation
Charge exchange
Adsorbed layers
Interface defects
Silica
Silicon
Multilayer
17O
Thin film
Thin films
Raman spectroscopy
GaMnAs
Ferromagnetic resonance
Aluminum
Silicon Carbide
Alloy
Topological defects
Nitridation
AFM
Topological insulators
Measurement
Aluminium
Rutherford backscattering spectrometry RBS
Density functional theory
13C
NRP
Periodic multilayer
Oxygen deficiency
7550Pp
7550Ee
ADSORPTION DESORPTION HYSTERESIS
Metal-insulator transition
Adsorption
HfO2
Annealing
EPR
Ageing
Silicon carbide
Oxidation
SiC
Ion beam analysis
Isotopic Tracing
Zinc oxide
Evaluation
Growth
18O resonance
17Opp
27Aldp
27Alda
Nanoparticles
Nuclear reaction analysis
Nanostructures
Low energy electron diffraction LEED
Acoustic propreties of solid
Acoustic
2H
Magnetization curves
Photoluminescence
Channeling
Capillary condensation
Energy loss
Alloys
ALD
Gallium oxide
Indium oxide
X-ray diffraction
7630Lh
Epitaxy