Simultaneous resistance and capacitance cartography by conducting probe atomic force microscopy in contact mode - Archive ouverte HAL

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Journal Articles Applied Physics Letters Year : 2005

Simultaneous resistance and capacitance cartography by conducting probe atomic force microscopy in contact mode

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1

Frédéric Houzé

Function : Author
PersonId : 13067
IdHAL : frederic-houze
ORCID : 0000-0001-8054-3184
IdRef : 15620584X

Laboratoire de génie électrique de Paris

Pascal Chrétien

Function : Author
PersonId : 5981
IdHAL : pascal-chretien

Laboratoire de génie électrique de Paris

Olivier Schneegans

Function : Author
PersonId : 15895
IdHAL : olivier-schneegans
ORCID : 0000-0001-9741-3327
IdRef : 18007007X

Laboratoire de génie électrique de Paris

René Meyer

Function : Author

Laboratoire de génie électrique de Paris

Lionel Boyer

Function : Author

Laboratoire de génie électrique de Paris

Olivier Schneegans : Connect in order to contact the contributor

https://hal-centralesupelec.archives-ouvertes.fr/hal-00320223

Submitted on : Wednesday, September 10, 2008-2:45:23 PM

Last modification on : Friday, March 24, 2023-2:52:50 PM

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hal-00320223 , version 1 (10-09-2008)

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HAL Id : hal-00320223 , version 1

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Frédéric Houzé, Pascal Chrétien, Olivier Schneegans, René Meyer, Lionel Boyer. Simultaneous resistance and capacitance cartography by conducting probe atomic force microscopy in contact mode. Applied Physics Letters, 2005, 86, pp.123103. ⟨hal-00320223⟩

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SUPELEC UPMC EC-PARIS CNRS SUP_LGEP CENTRALESUPELEC UNIV-PARIS-SACLAY SORBONNE-UNIVERSITE

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