Local electrical characterization of Schottky diodes on H-terminated diamond surfaces by conducting probe atomic force microscopy - Archive ouverte HAL Access content directly
Conference Papers Year : 2005

Local electrical characterization of Schottky diodes on H-terminated diamond surfaces by conducting probe atomic force microscopy

Frédéric Houzé
Laboratoire de génie électrique de Paris
CV
José Alvarez
Laboratoire de génie électrique de Paris
CV
Jean-Paul Kleider
Laboratoire de génie électrique de Paris
CV
P. Bergonzo
E. Snidero
  • Function : Author
D. Tromson
  • Function : Author

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https://hal-centralesupelec.archives-ouvertes.fr/hal-00320238

Submitted on : Wednesday, September 10, 2008-3:00:21 PM

Last modification on : Friday, March 24, 2023-2:52:50 PM

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hal-00320238 , version 1 (10-09-2008)

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Frédéric Houzé, José Alvarez, Jean-Paul Kleider, P. Bergonzo, E. Snidero, et al.. Local electrical characterization of Schottky diodes on H-terminated diamond surfaces by conducting probe atomic force microscopy. Diamond' 2005 (16th European Conference on Diamond, Diamond-Like Materials, Carbon Nanotubes and Nitrides), 2005, France. ⟨hal-00320238⟩

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