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Investigation of a-Si:H/c-Si heterojunction interface properties by admittance spectroscopy

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https://hal-centralesupelec.archives-ouvertes.fr/hal-00321101

Submitted on : Friday, September 12, 2008-12:57:04 PM

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hal-00321101 , version 1 (12-09-2008)

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  • HAL Id : hal-00321101 , version 1

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Alexander Gudovskikh, Jean-Paul Kleider. Investigation of a-Si:H/c-Si heterojunction interface properties by admittance spectroscopy. 4th AMS (international conference on Amorphous ans Microcrystalline Semiconductors), 2004, Russia. ⟨hal-00321101⟩

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SUPELEC UPMC EC-PARIS CNRS SUP_LGEP CENTRALESUPELEC UNIV-PARIS-SACLAY SORBONNE-UNIVERSITE
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