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Determination of defect states in semiconductors by the modulated photocurrent technique

Christophe Longeaud
Laboratoire de génie électrique de Paris

Olivier Schneegans  : Connect in order to contact the contributor

https://hal-centralesupelec.archives-ouvertes.fr/hal-00321264

Submitted on : Friday, September 12, 2008-4:33:41 PM

Last modification on : Friday, March 24, 2023-2:52:50 PM

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hal-00321264 , version 1 (12-09-2008)

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  • HAL Id : hal-00321264 , version 1

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Christophe Longeaud. Determination of defect states in semiconductors by the modulated photocurrent technique. XXVIII Encontro Nacional de Fisica da Materia Condensada- Sociedad de Fisica do Brasil, 2005, Brazil. ⟨hal-00321264⟩

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