Evaluating Properties of Graphene Sheets using Conductive Probe Atomic Force Microscopy

Fanny Hauquier; David Alamarguy; Sophie Noël; P. Viel

Conference Papers Year : 2009

Evaluating Properties of Graphene Sheets using Conductive Probe Atomic Force Microscopy

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Fanny Hauquier

Function : Author

Laboratoire de génie électrique de Paris

David Alamarguy

Function : Author
PersonId : 6437
IdHAL : david-alamarguy
ORCID : 0000-0001-7617-3029
IdRef : 081093373

Laboratoire de génie électrique de Paris

Sophie Noël

Function : Author
PersonId : 17556
IdHAL : sophie-noel
IdRef : 081093446

Laboratoire de génie électrique de Paris

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P. Viel

Function : Author

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Submitted on : Friday, January 8, 2010-12:45:54 PM

Last modification on : Tuesday, February 14, 2023-3:37:15 AM

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hal-00445400 , version 1 (08-01-2010)

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Fanny Hauquier, David Alamarguy, Sophie Noël, P. Viel. Evaluating Properties of Graphene Sheets using Conductive Probe Atomic Force Microscopy. MRS Fall Meeting, Nov 2009, Boston, United States. pp.K10.44. ⟨hal-00445400⟩

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Evaluating Properties of Graphene Sheets using Conductive Probe Atomic Force Microscopy

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