Non-destructive evaluation of small defects using an eddy current microcoil sensor array

Cyril Ravat; Yann Le Bihan; Pierre-Yves Joubert; Claude Marchand

Journal Articles Sensor letters Year : 2009

Non-destructive evaluation of small defects using an eddy current microcoil sensor array

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Cyril Ravat

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Laboratoire de génie électrique de Paris

Yann Le Bihan

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PersonId : 6436
IdHAL : yann-le-bihan
ORCID : 0000-0001-5563-9192
IdRef : 095667075

Laboratoire de génie électrique de Paris

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Pierre-Yves Joubert

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Claude Marchand

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IdHAL : claude-marchand
IdRef : 076292274

Laboratoire de génie électrique de Paris

CV

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Submitted on : Thursday, January 14, 2010-3:39:41 PM

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hal-00447228 , version 1 (14-01-2010)

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Cyril Ravat, Yann Le Bihan, Pierre-Yves Joubert, Claude Marchand. Non-destructive evaluation of small defects using an eddy current microcoil sensor array. Sensor letters, 2009, 7 (3), pp. 400-405. ⟨hal-00447228⟩

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Non-destructive evaluation of small defects using an eddy current microcoil sensor array

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