Low temperature amorphous growth of semiconducting Y-Ba-Cu-O oxide thin films in view of infrared bolometric detection

Vishal Jagtap; Annick Dégardin; Alain Kreisler

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Low temperature amorphous growth of semiconducting Y-Ba-Cu-O oxide thin films in view of infrared bolometric detection

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Vishal Jagtap

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Laboratoire de génie électrique de Paris

Annick Dégardin

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Laboratoire de génie électrique de Paris

Alain Kreisler

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IdHAL : alain-kreisler
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Laboratoire de génie électrique de Paris

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https://hal-centralesupelec.archives-ouvertes.fr/hal-00710705

Submitted on : Thursday, June 21, 2012-3:14:36 PM

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hal-00710705 , version 1 (21-06-2012)

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Vishal Jagtap, Annick Dégardin, Alain Kreisler. Low temperature amorphous growth of semiconducting Y-Ba-Cu-O oxide thin films in view of infrared bolometric detection. Spring Meeting of the European Materials Science Society (E-MRS 2011), 2011, Nice, France. ⟨hal-00710705⟩

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Low temperature amorphous growth of semiconducting Y-Ba-Cu-O oxide thin films in view of infrared bolometric detection

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