Coil-to-sample distance influence on contactless QSSPC effective lifetime measurements : application to silicon wafers passivated by thin amorphous layers - Archive ouverte HAL Access content directly
Conference Papers Year : 2011

Coil-to-sample distance influence on contactless QSSPC effective lifetime measurements : application to silicon wafers passivated by thin amorphous layers

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https://hal-centralesupelec.archives-ouvertes.fr/hal-00710780

Submitted on : Thursday, June 21, 2012-3:53:51 PM

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hal-00710780 , version 1 (21-06-2012)

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  • HAL Id : hal-00710780 , version 1

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Wilfried Favre, Laroussi Bettaieb, J. Després, José Alvarez, Jean-Paul Kleider, et al.. Coil-to-sample distance influence on contactless QSSPC effective lifetime measurements : application to silicon wafers passivated by thin amorphous layers. 26th EU PVSEC, Sep 2011, Hambourg, Germany. ⟨hal-00710780⟩

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SUPELEC UPMC EC-PARIS CNRS SUP_LGEP CENTRALESUPELEC UNIV-PARIS-SACLAY SORBONNE-UNIVERSITE
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