Fast simulation method of multiple narrow cracks in planar stratified media

Roberto Miorelli (1) , Christophe Reboud (1) , Dominique Lesselier (2) , Theodoros Theodoulidis (3)

1 DISC - Département Imagerie et Simulation pour le Contrôle
2 DRE - Département de Recherche en Electromagnétisme ; EMG - Département Electromagnétisme - L2S
3 Department of Mechanical Engineering

A semi-analytical approach is proposed for the rapid calculation of electromagnetic fields induced in a planar stratified media by inductive sensors with complex shapes. Theoretical aspects of the method and new shapes modelled are presented, then comparisons of results obtained in classical cases with reference data are discussed. Finally, an application of this development to the simulation of eddy current testing with a semi-analytical model is detailed.

Keywords: semi-analytical modeling; boundary element method; discrete complex image method; generalized pencil of functions method; Eddy current testing; thin cracks

Domains: Engineering Sciences [physics]; Electromagnetism

Roberto Miorelli, Christophe Reboud, Dominique Lesselier, Theodoros Theodoulidis. Fast simulation method of multiple narrow cracks in planar stratified media. B. Rao and T. Jayakumar and K. Balasubramanian and B. Raj. Electromagnetic Non-Destructive Evaluation (XV), 36, IOS Press, pp.11-18, 2012, Studies in Applied Electromagnetics and Mechanics, ⟨10.3233/978-1-60750-968-4-11⟩. ⟨hal-00742860⟩