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Conference Papers Year : 2013

BEM modeling for ECT simulation of complex narrow cracks in multilayered structures

Abstract

Simulation of Eddy Current Testing (ECT) signals due to real cracks constitutes a matter of interest in many industrial fields. Such complex flaws can be modeled as a succession of narrow crack with canonical shapes (i.e. slot, elliptical, semi-elliptical, etc.) having arbitrary positions and orientations. This paper present a semi-analytical model dedicated to the simulation of ECT inspections of stratified planar structures, affected by narrow crack. Validation of the developments, carried out with experimental data or by comparison with other numerical results, are then discussed.
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Dates and versions

hal-00821796 , version 1 (13-05-2013)

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Roberto Miorelli, Christophe Reboud, Theodoros Theodoulidis, Dominique Lesselier. BEM modeling for ECT simulation of complex narrow cracks in multilayered structures. REVIEW OF PROGRESS IN QUANTITATIVE NONDESTRUCTIVE EVALUATION, Jul 2012, Denver, United States. pp.441-448, ⟨10.1063/1.4789081⟩. ⟨hal-00821796⟩
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