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Minimum thermal conductivity in free-standing SiGe thin films

Antoine Iskandar 1 Wassim Kassem 2 Alain Abou Khalil 3 Sebastian Volz 2 Michel Kazan 4 
1 CGI - Centre de Géologie de l'Ingénieur
2 EM2C - Laboratoire d'Énergétique Moléculaire et Macroscopique, Combustion
3 CELIA - Centre d'Etudes Lasers Intenses et Applications
4 Department of Physics
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Journal articles
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https://hal-centralesupelec.archives-ouvertes.fr/hal-01285887
Contributor : Sebastian VOLZ Connect in order to contact the contributor
Submitted on : Wednesday, March 9, 2016 - 7:29:37 PM
Last modification on : Tuesday, March 29, 2022 - 3:01:56 AM

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  • HAL Id : hal-01285887, version 1

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CEA | INSTITUT-TELECOM | ENSMP | CNRS | EM2C | EM2C-TRANSFERTS | ENSMP_GEOSCIENCES | PARISTECH | CENTRALESUPELEC | DAM | PSL | UNIV-PARIS-SACLAY | ENSMP_DR | GS-ENGINEERING

Citation

Antoine Iskandar, Wassim Kassem, Alain Abou Khalil, Sebastian Volz, Michel Kazan. Minimum thermal conductivity in free-standing SiGe thin films. Journal of Applied Physics, American Institute of Physics, 2015. ⟨hal-01285887⟩

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