Journal Articles
IEEE Transactions on Reliability
Year : 2016
Claude Delpha : Connect in order to contact the contributor
https://hal-centralesupelec.archives-ouvertes.fr/hal-01366652
Submitted on : Thursday, September 15, 2016-10:02:29 AM
Last modification on : Friday, March 24, 2023-2:53:02 PM
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Jinane Harmouche, Claude Delpha, Demba Diallo, Yann Le Bihan. Statistical Approach for Nondestructive Incipient Crack Detection and Characterization Using Kullback-Leibler Divergence. IEEE Transactions on Reliability, 2016, 65 (3), pp.1360-1368. ⟨10.1109/TR.2016.2570549⟩. ⟨hal-01366652⟩
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