https://hal-centralesupelec.archives-ouvertes.fr/hal-01366652
Contributeur : Claude Delpha
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Soumis le : jeudi 15 septembre 2016 - 10:02:29
Dernière modification le : vendredi 23 novembre 2018 - 01:29:14
Jinane Harmouche, Claude Delpha, Demba Diallo, Yann Le Bihan. Statistical Approach for Nondestructive Incipient Crack Detection and Characterization Using Kullback-Leibler Divergence. IEEE Transactions on Reliability, Institute of Electrical and Electronics Engineers, 2016, 65 (3), pp.1360-1368. 〈10.1109/TR.2016.2570549〉. 〈hal-01366652〉
