Statistical Approach for Nondestructive Incipient Crack Detection and Characterization Using Kullback-Leibler Divergence

Jinane Harmouche (1) , Claude Delpha (1) , Demba Diallo (2) , Yann Le Bihan (2)

1 L2S - Laboratoire des signaux et systèmes
2 GeePs - Laboratoire Génie électrique et électronique de Paris

Domains: Signal and Image processing

Jinane Harmouche, Claude Delpha, Demba Diallo, Yann Le Bihan. Statistical Approach for Nondestructive Incipient Crack Detection and Characterization Using Kullback-Leibler Divergence. IEEE Transactions on Reliability, 2016, 65 (3), pp.1360-1368. ⟨10.1109/TR.2016.2570549⟩. ⟨hal-01366652⟩