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Journal articles
Statistical Approach for Nondestructive Incipient Crack Detection and Characterization Using Kullback-Leibler Divergence
Jinane Harmouche 1
Author
Claude Delpha 1
Author IdHAL : claude-delpha ORCID : https://orcid.org/0000-0003-3224-8628
Demba Diallo 2
Author IdHAL : demba-diallo
Yann Le Bihan 2
Author
1
L2S - Laboratoire des signaux et systèmes (Plateau de Moulon 3 rue Joliot Curie 91192 GIF SUR YVETTE CEDEX - France)
- UP11 - Université Paris-Sud - Paris 11 (Bâtiment 300 - 91405 Orsay cedex - France)
- CentraleSupélec (3, rue Joliot Curie, Plateau de Moulon, 91192 GIF-SUR-YVETTE Cedex - France)
- CNRS - Centre National de la Recherche Scientifique (France)
2
GeePs - Laboratoire Génie électrique et électronique de Paris (11, rue Joliot Curie
Plateau de Moulon
91192 Gif sur Yvette - France)
- UP11 - Université Paris-Sud - Paris 11 (Bâtiment 300 - 91405 Orsay cedex - France)
- UPMC - Université Pierre et Marie Curie - Paris 6 (4 place Jussieu - 75005 Paris - France)
- CentraleSupélec (3, rue Joliot Curie, Plateau de Moulon, 91192 GIF-SUR-YVETTE Cedex - France)
- CNRS - Centre National de la Recherche Scientifique : UMR8507 (France)
Document type :
Journal articles
Complete list of metadata
https://hal-centralesupelec.archives-ouvertes.fr/hal-01366652
Contributor : Claude Delpha Connect in order to contact the contributor
Submitted on : Thursday, September 15, 2016 - 10:02:29 AM
Last modification on : Thursday, September 9, 2021 - 3:02:43 AM
Contributor : Claude Delpha Connect in order to contact the contributor
Submitted on : Thursday, September 15, 2016 - 10:02:29 AM
Last modification on : Thursday, September 9, 2021 - 3:02:43 AM
Identifiers
- HAL Id : hal-01366652, version 1
- DOI : 10.1109/TR.2016.2570549
Collections
CENTRALESUPELEC | CNRS | UPMC | SUP_LSS | GEEPS | SUP_SIGNAUX | ECO2 | PIEM | SORBONNE-UNIVERSITE | SU-SCIENCES | GS-COMPUTER-SCIENCE | GS-ENGINEERING | INSTITUT-SCIENCES-LUMIERE
Citation
Jinane Harmouche, Claude Delpha, Demba Diallo, Yann Le Bihan. Statistical Approach for Nondestructive Incipient Crack Detection and Characterization Using Kullback-Leibler Divergence. IEEE Transactions on Reliability, Institute of Electrical and Electronics Engineers, 2016, 65 (3), pp.1360-1368. ⟨10.1109/TR.2016.2570549⟩. ⟨hal-01366652⟩
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