Measurable lower limit of thin film conductivity with parallel plate waveguide terahertz time domain spectroscopy

Manjakavahoaka Razanoelina; Shohei Ohashi; Iwao Kawayama; Hironaru Murakami; Annick Dégardin; Alain J. Kreisler; Masayoshi Tonouchi

doi:10.1364/OL.42.003056

Journal articles

Measurable lower limit of thin film conductivity with parallel plate waveguide terahertz time domain spectroscopy

Manjakavahoaka Razanoelina ¹ Shohei Ohashi ¹ Iwao Kawayama ¹ Hironaru Murakami ¹ Annick Dégardin ² Alain J. Kreisler ² Masayoshi Tonouchi ¹

1 Institute of laser Engineering

2 GeePs - Laboratoire Génie électrique et électronique de Paris

Document type :

Journal articles

Domain :

Physics [physics] / Physics [physics] / Optics [physics.optics]

Physics [physics] / Condensed Matter [cond-mat]

Physics [physics] / Condensed Matter [cond-mat] / Materials Science [cond-mat.mtrl-sci]

Engineering Sciences [physics] / Electromagnetism

Engineering Sciences [physics] / Materials

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https://hal-centralesupelec.archives-ouvertes.fr/hal-01633904
Contributor : Alain Kreisler Connect in order to contact the contributor
Submitted on : Monday, November 13, 2017 - 3:10:07 PM
Last modification on : Saturday, June 25, 2022 - 10:27:27 PM

Measurable lower limit of thin film conductivity with parallel plate waveguide terahertz time domain spectroscopy

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Measurable lower limit of thin film conductivity with parallel plate waveguide terahertz time domain spectroscopy

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