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Poster communications

Passivated Selective Contact Structure Characterization by C-AFM and KPFM of the Conduction by Pinholes

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https://hal-centralesupelec.archives-ouvertes.fr/hal-02344005
Contributor : Jean-Paul Kleider <>
Submitted on : Sunday, November 3, 2019 - 6:44:33 PM
Last modification on : Tuesday, September 22, 2020 - 3:38:39 AM

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  • HAL Id : hal-02344005, version 1

Citation

Clément Marchat, Audrey Morisset, José Alvarez, Raphaël Cabal, Marie-Estelle Gueunier, et al.. Passivated Selective Contact Structure Characterization by C-AFM and KPFM of the Conduction by Pinholes. 28th International Conference on Amorphous and nanocrystalline Semiconductors (ICANS 28), Aug 2019, Palaiseau, France. ⟨hal-02344005⟩

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