Passivated Selective Contact Structure Characterization by C-AFM and KPFM of the Conduction by Pinholes

Physics [physics] Condensed Matter [cond-mat] Materials Science [cond-mat.mtrl-sci] Engineering Sciences [physics] Micro and nanotechnologies/Microelectronics Engineering Sciences [physics] Electric power Engineering Sciences [physics] Optics / Photonic Engineering Sciences [physics] Materials

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Submitted on : Sunday, November 3, 2019-6:44:33 PM

Last modification on : Friday, March 24, 2023-2:53:13 PM

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hal-02344005 , version 1 (03-11-2019)

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HAL Id : hal-02344005 , version 1

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Clément Marchat, Audrey Morisset, José Alvarez, Raphaël Cabal, Marie-Estelle Gueunier, et al.. Passivated Selective Contact Structure Characterization by C-AFM and KPFM of the Conduction by Pinholes. 28th International Conference on Amorphous and nanocrystalline Semiconductors (ICANS 28), Aug 2019, Palaiseau, France. ⟨hal-02344005⟩

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