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Conference poster

Passivated Selective Contact Structure Characterization by C-AFM and KPFM of the Conduction by Pinholes

Clément Marchat 1, 2 Audrey Morisset 2, 1, 3 José Alvarez 2 Raphaël Cabal 3 Marie-Estelle Gueunier 2 Jean-Paul Kleider 2 
1 IPVF - Institut Photovoltaïque d’Ile-de-France (UMR)
2 GeePs - Laboratoire Génie électrique et électronique de Paris
3 INES - Institut National de L'Energie Solaire
Document type :
Conference poster
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https://hal-centralesupelec.archives-ouvertes.fr/hal-02344005
Contributor : Jean-Paul KLEIDER Connect in order to contact the contributor
Submitted on : Sunday, November 3, 2019 - 6:44:33 PM
Last modification on : Sunday, June 26, 2022 - 2:42:31 AM

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  • HAL Id : hal-02344005, version 1

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Citation

Clément Marchat, Audrey Morisset, José Alvarez, Raphaël Cabal, Marie-Estelle Gueunier, et al.. Passivated Selective Contact Structure Characterization by C-AFM and KPFM of the Conduction by Pinholes. 28th International Conference on Amorphous and nanocrystalline Semiconductors (ICANS 28), Aug 2019, Palaiseau, France. ⟨hal-02344005⟩

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