Halide Perovskite Thin Films Characterisation by Force Microscopy Techniques

Aleksandra Bojar (1, 2) , Clément Marchat (2, 1) , J Alvarez (1, 2) , Philip Schulz (3, 2) , Jean-Paul Kleider (1, 2)

1 GeePs - Laboratoire Génie électrique et électronique de Paris
2 IPVF - Institut Photovoltaïque d’Ile-de-France (UMR)
3 CNRS - Centre National de la Recherche Scientifique

Domains: Materials Science [cond-mat.mtrl-sci]; Micro and nanotechnologies/Microelectronics; Electric power; Optics / Photonic; Materials

Aleksandra Bojar, Clément Marchat, J Alvarez, Philip Schulz, Jean-Paul Kleider. Halide Perovskite Thin Films Characterisation by Force Microscopy Techniques. JNPV 2019, Dec 2019, Dourdan, France. ⟨hal-02344113⟩