Analysis of the Performance of the I-V Curve Correction Methods in the Presence of Defects

Baojie Li (1, 2) , Anne Migan-Dubois (1) , Claude Delpha (3) , Demba Diallo (1)

1 GeePs - Laboratoire Génie électrique et électronique de Paris
2 L2EI - Laboratoire d'Electrotechnique et d'Electronique Industrielle, L2EI, [Université Jilel]
3 L2S - Laboratoire des signaux et systèmes

Domains: Signal and Image processing; Electric power

Baojie Li, Anne Migan-Dubois, Claude Delpha, Demba Diallo. Analysis of the Performance of the I-V Curve Correction Methods in the Presence of Defects. 37th European Photovoltaic Solar Energy Conference and Exhibition (EU PVSEC 2020), Sep 2020, Lisbon, Portugal. ⟨hal-02903352⟩