Electronic and structural properties of the amorphous/crystalline silicon interface

Jean-Paul Kleider; Rémy Chouffot; A.S. Gudovskikh; Pere Roca I Cabarrocas; M. Labrune; P.J. Ribeyron; R. Brüggemann

Journal Articles Thin Solid Films Year : 2009

Electronic and structural properties of the amorphous/crystalline silicon interface

(1) , (1) , , , , ,

1

Jean-Paul Kleider

Function : Author
PersonId : 5984
IdHAL : jean-paul-kleider
ORCID : 0000-0003-4388-6326
IdRef : 03273039X

Laboratoire de génie électrique de Paris

CV

Rémy Chouffot

Function : Author

Laboratoire de génie électrique de Paris

A.S. Gudovskikh

Function : Author

Pere Roca I Cabarrocas

Function : Author
PersonId : 760063
ORCID : 0000-0003-2241-2762
IdRef : 034125663

M. Labrune

Function : Author

P.J. Ribeyron

Function : Author

R. Brüggemann

Function : Author

Olivier Schneegans : Connect in order to contact the contributor

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Submitted on : Monday, January 11, 2010-4:16:19 PM

Last modification on : Friday, March 24, 2023-2:52:52 PM

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hal-00445964 , version 1 (11-01-2010)

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Jean-Paul Kleider, Rémy Chouffot, A.S. Gudovskikh, Pere Roca I Cabarrocas, M. Labrune, et al.. Electronic and structural properties of the amorphous/crystalline silicon interface. Thin Solid Films, 2009, 517, pp. 6386-6391. ⟨hal-00445964⟩

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Electronic and structural properties of the amorphous/crystalline silicon interface

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