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Hydrogenated amorphous silicon characterization from steady state photoconductive measurements

Leonardo Kopprio 1 Christophe Longeaud 2 Javier Schmidt 1
1 UNL - Universidad Nacional del Litoral [Santa Fe]
2 GeePs - Laboratoire Génie électrique et électronique de Paris
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https://hal-centralesupelec.archives-ouvertes.fr/hal-02280592
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Submitted on : Wednesday, October 30, 2019 - 5:37:31 PM
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CNRS | SU-SCIENCES | SORBONNE-UNIVERSITE | UNIV-PARIS-SACLAY | PHEMADIC | GEEPS | CENTRALESUPELEC

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Leonardo Kopprio, Christophe Longeaud, Javier Schmidt. Hydrogenated amorphous silicon characterization from steady state photoconductive measurements. Semiconductor Science and Technology, IOP Publishing, 2019, 34 (4), ⟨10.1088/1361-6641/ab0765⟩. ⟨hal-02280592⟩

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