Round-Robin Measurements of Linewidth Enhancement Factor of Semiconductor Lasers in COST 288 Action - CentraleSupélec Access content directly
Conference Papers Year : 2007

Round-Robin Measurements of Linewidth Enhancement Factor of Semiconductor Lasers in COST 288 Action

Guido Giuliani
  • Function : Author
Silvano Donati
  • Function : Author
Asier Villafranca
  • Function : Author
Javier Lasobras
  • Function : Author
Ignacio Garces
  • Function : Author
Marek Chacinski
  • Function : Author
Richard Schatz
  • Function : Author
Christos Kouloumentas
  • Function : Author
Dimitrios Klonidis
  • Function : Author
Ioannis Tomkos
  • Function : Author
Pascal Landais
  • Function : Author
Raul Escorihuela
  • Function : Author
Judy Rorison
  • Function : Author
Jose Pozo
  • Function : Author
Andrea Fiore
  • Function : Author
Pablo Moreno
Marco Rossetti
  • Function : Author
Jens von Staden
  • Function : Author
Guillaume Huyet
  • Function : Author
Mika Saarinen
  • Function : Author
Markus Pessa
  • Function : Author
Pirjo Leinonen
  • Function : Author
Ville Vilokkinen
  • Function : Author
Jan Danckaert
  • Function : Author
Thomas Fordell
  • Function : Author
Asa Lindberg
  • Function : Author
Jean-François Hayau
  • Function : Author
Mauro Pereira
  • Function : Author
Rikard Nelander
  • Function : Author
Andreas Wacker
  • Function : Author
Alessandro Tredicucci
  • Function : Author
Richard M. Green
  • Function : Author

Abstract

Round-Robin measurements on the linewidth enhancement factor are carried out in many laboratories participating to EU COST 288 Action. Up to 7 different techniques are applied to DFB, VCSELs, QCL, and QD lasers, and results are compared.

Dates and versions

hal-00258778 , version 1 (25-02-2008)

Identifiers

Cite

Guido Giuliani, Silvano Donati, Asier Villafranca, Javier Lasobras, Ignacio Garces, et al.. Round-Robin Measurements of Linewidth Enhancement Factor of Semiconductor Lasers in COST 288 Action. CLEO/Europe-IQEC 2007, Jun 2007, Munich, Germany. pp.1-1, ⟨10.1109/CLEOE-IQEC.2007.4385967⟩. ⟨hal-00258778⟩
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